Tuning of undoped ZnO thin film via plasma enhanced atomic layer deposition and its application for an inverted polymer solar cell

Type:
Journal
Info:
AIP ADVANCES 3, 102114 (2013)
Date:
2013-09-26

Author Information

Name Institution
Mi-Jin JinUlsan National Institute of Science and Technology
Junhyeon JoUlsan National Institute of Science and Technology
Guru P. NeupaneSungkyunkwan University
Youngjun KimSungkyunkwan University
Ki-Seok AnKorea Research Institute of Chemical Technology
Jung-Woo YooUlsan National Institute of Science and Technology

Films

Plasma ZnO


Film/Plasma Properties

Characteristic: Thickness
Analysis: Profilometry

Characteristic: Resistivity, Sheet Resistance
Analysis: Four-point Probe

Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Characteristic: Open Circuit Voltage
Analysis: I-V, Current-Voltage Measurements

Characteristic: Short Circuit Current
Analysis: I-V, Current-Voltage Measurements

Characteristic: Fill Factor
Analysis: I-V, Current-Voltage Measurements

Characteristic: Efficiency
Analysis: I-V, Current-Voltage Measurements

Substrates

ITO

Notes

603