Excellent surface passivation of crystalline silicon by ternary AlxMg1-xOy thin films

Type:
Conference Proceedings
Info:
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Date:
2016-06-05

Author Information

Name Institution
Hyunju LeeToyota Technological Institute
Takefumi KamiokaToyota Technological Institute
Dongyan ZhangToyota Technological Institute
Naotaka IwataToyota Technological Institute
Yoshio OhshitaToyota Technological Institute

Films


Film/Plasma Properties

Characteristic: Surface Recombination Velocity
Analysis: -

Characteristic: Efficiency
Analysis: -

Characteristic: Interface Trap Density
Analysis: -

Substrates

Silicon

Notes

939