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Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment
Type:
Journal
Info:
Ultramicroscopy 182 (2017) 233-242
Date:
2017-07-09
Author Information
| Name | Institution |
|---|---|
| Rik V. Mom | Leiden University |
| Willem G. Onderwaater | Leiden University |
| Marcel J. Rost | Leiden University |
| Maciej Jankowski | European Synchrotron Radiation Facility (ESRF) |
| Sabine Wenzel | Leiden University |
| Leon Jacobse | Leiden University |
| Paul F.A. Alkemade | Delft University of Technology |
| Vincent Vandalon | Eindhoven University of Technology |
| Matthijs A. van Spronsen | Leiden University |
| Matthijs van Weeren | Leiden University |
| Bert Crama | Leiden University |
| Peter van der Tuijn | Leiden University |
| Roberto Felici | European Synchrotron Radiation Facility (ESRF) |
| Erwin (W.M.M.) Kessels | Eindhoven University of Technology |
| Francesco Carlà | European Synchrotron Radiation Facility (ESRF) |
| Joost W.M. Frenken | Leiden University |
| Irene M.N. Groot | Leiden University |
Films
Film/Plasma Properties
Substrates
| Pt |
| Ir |
Notes
| 1137 |